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Proceedings Paper

High-resolution near-field measurements of microwave circuits
Author(s): R. Kantor; I. V. Shvets
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Paper Abstract

In this paper we report on measurements of electric field intensities of microwave field above surface of microwave circuits using miniaturized coaxial antennas. During the scanning process the antenna is driven at various distances above the sample surface according to topographic data acquired prior to the field measurement. A position/signal difference method is used to increase the spatial resolution of the antenna to about 20 μm (λ/104) -- one order of magnitude better than contemporary microwave scanning systems. For measurement of the tangential field components parallel to the sample surface the antenna is tilted by about 45° relative to the sample surface. By its rotation about the vertical axis various components of the field are measured, vertical and horizontal electric field intensities are recalculated. Performance of our scanning system utilizing these methods is tested using a PCB surface capacitor, a microstrip filter and a microstrip transmission line.

Paper Details

Date Published: 7 April 2004
PDF: 6 pages
Proc. SPIE 5445, Microwave and Optical Technology 2003, (7 April 2004); doi: 10.1117/12.560715
Show Author Affiliations
R. Kantor, Trinity College (Ireland)
I. V. Shvets, Trinity College (Ireland)


Published in SPIE Proceedings Vol. 5445:
Microwave and Optical Technology 2003
Jaromir Pistora; Kamil Postava; Miroslav Hrabovsky; Banmali S. Rawat, Editor(s)

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