Share Email Print
cover

Proceedings Paper

Real-time phase-contrast analysis of domain switching in lithium niobate by digital holography
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We present a method for in-situ visualization of electric field domain reversal in congruent lithium niobate (LN) through an electro-optic interferometric technique. The crystal refractive index n changes by the linear electro-optic and piezoelectric effects along the z crystal axis, due to the external electric field. This variation depends on the domain orientation so that two adjacent antiparallel domains present a refractive index difference equal to 2Dn which is used for in-situ visualization of the reversed domain pattern during formation. A digital holographic (DH) technique is employed for a two-dimensional (2D) reconstruction of the wavefield transmitted by the sample in amplitude and phase during the process. The corresponding amplitude-map and phase-map movies are presented. The amplitude-map gives qualitative information about the spatial evolution of the domain boundaries while the phase-map provides measurement of the 2D distribution of the phase shift induced along the z axis. The phase-map movies provide unequivocal information about the spatial distribution of the reversed domain regions. This technique can be used as in-situ monitoring method alternative to the measurement of the poling current which provides information only about the amount of charge delivered to the sample, ignoring the spatial distribution of the domain boundaries.

Paper Details

Date Published: 2 August 2004
PDF: 9 pages
Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); doi: 10.1117/12.560632
Show Author Affiliations
Simonetta Grilli, Istituto Nazionale di Ottica Applicata (Italy)
Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy)
Marella de Angelis, Istituto di Cibernetica E. Caianiello, CNR (Italy)
Sergio De Nicola, Istituto di Cibernetica E. Caianiello, CNR (Italy)
Domenico Alfieri, Istituto Nazionale di Ottica Applicata (Italy)
Istituto di Cibernetica E. Caianiello, CNR (Italy)
Melania Paturzo, Istituto Nazionale di Ottica Applicata (Italy)
Istituto di Cibernetica E. Caianiello, CNR (Italy)
Paolo De Natale, Istituto Nazionale di Ottica Applicata (Italy)
Lucia Sansone, Istituto Nazionale di Ottica Applicata (Italy)
Istituto di Cibernetica E. Caianiello, CNR (Italy)
Giovanni Pierattini, Istituto di Cibernetica E. Caianiello, CNR (Italy)


Published in SPIE Proceedings Vol. 5531:
Interferometry XII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

© SPIE. Terms of Use
Back to Top