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Proceedings Paper

Device for spectral emissivity measurements of ceramics using a FT-IR spectrometer
Author(s): Wolfgang Bauer; Alexander Moldenhauer
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Paper Abstract

Ceramic materials, in particular high temperature technical ceramics and refractories, are used in a wide range of temperature. Band and total emissivities of ceramics are needed for non-contact temperature measurements and for modeling of radiation heat transfer. If the spectral emissivities are known in a sufficient range of wavelength and temperature, the band and total emissivities for most applications can be calculated. At the University Duisburg-Essen an experimental setup for measuring of temperature-dependent spectral emissivities was modernized with a FT-IR-spectrometer. A remarkable quality improvement of the measurements could be reached. The spectral and temperature ranges of the measuring device are now 0.8 to 25 μm and 100 to 1200°C. In the paper a description of the measuring device will be given and selected examples of measuring possibilities of the spectrometer are shown. By the example of high temperature ceramics the obtained improvements of the device are presented for measured temperature-dependent spectral emissivities.

Paper Details

Date Published: 2 August 2004
PDF: 12 pages
Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); doi: 10.1117/12.560602
Show Author Affiliations
Wolfgang Bauer, Univ. Duisburg-Essen (Germany)
Alexander Moldenhauer, Univ. Duisburg-Essen (Germany)

Published in SPIE Proceedings Vol. 5532:
Interferometry XII: Applications
Wolfgang Osten; Erik Novak, Editor(s)

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