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Proceedings Paper

An accumulative x-ray streak camera with 280-fs resolution
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Paper Abstract

We demonstrated a significant improvement in the resolution of the x-ray streak camera by reducing the electron beam size in the deflection plates. This was accomplished by adding a slit in front of the focusing lens and the deflection plates. The temporal resolution reached 280 fs when the slit width was 5 mm. The camera was operated in an accumulative mode and tested by using a 25 fs laser with 2 kHz repetition rate and 1-2% RMS pulse energy stability. We conclude that deflection aberrations, which limit the resolution of the camera, can be appreciably reduced by eliminating the wide-angle electrons.

Paper Details

Date Published: 10 November 2004
PDF: 7 pages
Proc. SPIE 5534, Fourth Generation X-Ray Sources and Optics II, (10 November 2004); doi: 10.1117/12.560526
Show Author Affiliations
Mahendra Man Shakya, Kansas State Univ. (United States)
Zenghu Chang, Kansas State Univ. (United States)


Published in SPIE Proceedings Vol. 5534:
Fourth Generation X-Ray Sources and Optics II
Sandra G. Biedron; Wolfgang Eberhardt; Tetsuya Ishikawa; Roman O. Tatchyn, Editor(s)

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