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Proceedings Paper

An assessment of yttrium optical constants EUV using Mo/Y multilayers designed as in the linear polarizers
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Paper Abstract

We have produced and characterized Mo/Y multilayers designed as linear-polarizers for use near λ ~ 8 nm. By depositing these films directly onto silicon photodiodes, we are able to measure both reflectance and transmittance in the EUV using synchrotron radiation. These measurements have been used to access the accuracy of yttrium optical constants in this wavelength range. We describe our experimental results and discuss the prospects for the future development of efficient EUV polarization elements.

Paper Details

Date Published: 14 October 2004
PDF: 6 pages
Proc. SPIE 5538, Optical Constants of Materials for UV to X-Ray Wavelengths, (14 October 2004); doi: 10.1117/12.560465
Show Author Affiliations
Benjawan Kjornrattanawanich, Brookhaven National Lab. (United States)
Regina Soufli, Lawrence Livermore National Lab. (United States)
Sasa Bajt, Lawrence Livermore National Lab. (United States)
David L. Windt, Columbia Astrophysics Lab. (United States)
John F. Seely, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 5538:
Optical Constants of Materials for UV to X-Ray Wavelengths
Regina Soufli; John F. Seely, Editor(s)

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