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Proceedings Paper

Using a sheet of specklegram: the development of fringe analysis method for ESPI
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Paper Abstract

The ordinary fringe analysis method based on Fourier transform cannot analyze a closed fringes using only single specklegram produced with two sheets of speckle patterns before and after deformation. On the basis of this discussion, the novel fringe analysis method is proposed in this paper. In the proposed method, not a specklegram but speckle patterns that produce the specklgram are directly analyzed using Fourier transform technology. Then, the ordinary problems can be solved by the proposed method. In the experiment, it is confirmed that the new proposed method can analyze an out-of-plane displacement using only two sheets of speckle patterns before and after deformation.

Paper Details

Date Published: 2 August 2004
PDF: 12 pages
Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); doi: 10.1117/12.560333
Show Author Affiliations
Yasuhiko Arai, Kansai Univ. (Japan)
Shunsuke Yokozeki, Kyushu Institute of Technology (Japan)


Published in SPIE Proceedings Vol. 5531:
Interferometry XII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

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