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Proceedings Paper

Hard x-ray Fresnel prisms: properties and applications
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Paper Abstract

To image weakly absorbing materials (e.g. biological specimens, thin films, etc.) with hard x-ray photons, phase-contrast methods have to be applied to enhance the image contrast. Micro-fabricated Fresnel prisms in silicon have been manufactured to enable wavefront division of the incoming x-ray beam for phase-contrast applications. To maximize the efficiency and aperture of these optics, multiples of 2π phase-shifting regions in a conventional prism structure have been deleted, leading to structures that are arrays of micro-prisms. We show preliminary results of x-ray beam deflection using a variety of micro-prism arrays at the NSLS X13B undulator beamline at 11.3 keV.

Paper Details

Date Published: 4 November 2004
PDF: 7 pages
Proc. SPIE 5539, Design and Microfabrication of Novel X-Ray Optics II, (4 November 2004); doi: 10.1117/12.560323
Show Author Affiliations
James M. Ablett, Brookhaven National Lab. (United States)
Kenneth Evans-Lutterodt, Brookhaven National Lab. (United States)
Aaron Stein, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 5539:
Design and Microfabrication of Novel X-Ray Optics II
Anatoly A. Snigirev; Derrick C. Mancini, Editor(s)

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