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Proceedings Paper

Noise analysis and image denoising for DEI
Author(s): Miles N. Wernick; Jovan G. Brankov; Alejandro Saiz-Herranz
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Paper Abstract

Herein we present a quantitative noise analysis of diffraction enhanced imaging (DEI), an x-ray imaging method that produces absorption and refraction images, with inherent immunity to wide-angle scatter. DEI can be used for planar imaging or computed tomography. DEI produces excellent images, but requires an x-ray source of very high power; therefore, it has principally been confined to synchrotron studies. Clinical systems currently under development using conventional x-ray sources will be photon-limited. Therefore, it is important that the noise properties of DEI be understood. We derive mathematical expressions for the noise statistics of DEI images, and show that the original formulation of DEI, given by Chapman, et al, is the maximum-likelihood solution of the image-estimation problem for the case of Poisson noise. However, we find that the standard DEI solution is only unbiased under particular conditions, which must be obeyed if good results are to be achieved. We also present the results of applying various noise-reduction filters, which we found to be very effective in reducing noise variance while introducing little bias.

Paper Details

Date Published: 26 October 2004
PDF: 9 pages
Proc. SPIE 5535, Developments in X-Ray Tomography IV, (26 October 2004); doi: 10.1117/12.560203
Show Author Affiliations
Miles N. Wernick, Illinois Institute of Technology (United States)
Jovan G. Brankov, Illinois Institute of Technology (United States)
Alejandro Saiz-Herranz, Illinois Institute of Technology (United States)


Published in SPIE Proceedings Vol. 5535:
Developments in X-Ray Tomography IV
Ulrich Bonse, Editor(s)

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