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Proceedings Paper

Polarization scatter measurements with a Mueller matrix imaging polarimeter
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Paper Abstract

A Mueller matrix imaging polarimeter is used to acquire polarization-sensitive images of seven different manmade samples in multiple scattering geometries. Successive Mueller matrix images of a sample with changing incidence and scatter angles are used to develop a Mueller matrix bidirectional reflectance distribution function for the sample in one plane of measurement. The Mueller matrix bidirectional reflectance distribution functions are compared, and patterns are noted. The most significant data for the scattering samples measured occurs along the diagonal of the respective Mueller matrices, indicating significant depolarization effects. Reduced depolarization data in the form of the average degree of polarization (of exiting light) for each sample is examined as a function of changing scattering geometry. Five of seven manmade samples exhibit an inverted Gaussian profile of depolarization with changing scattering geometry, the shape of which may prove useful for measuring sample properties (e.g. roughness) and for classifying or categorizing samples in a remote sensing scheme. Depolarization differences for each sample in response to changing incident polarization states are also examined, and a new metric, the degree of polarization surface, has been developed to visualize all such data simultaneously.

Paper Details

Date Published: 15 October 2004
PDF: 12 pages
Proc. SPIE 5526, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control, (15 October 2004); doi: 10.1117/12.560202
Show Author Affiliations
Brian J. DeBoo, Goodrich Corp. (United States)
Russell Chipman, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 5526:
Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control
John C. Fleming; Philip T. C. Chen; Michael G. Dittman, Editor(s)

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