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Proceedings Paper

Specular diffraction on nanometric grating
Author(s): Dalibor Ciprian; Jaromir Pistora
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Paper Abstract

Nanometric diffraction grating structure exhibits the same macroscopic properties as the effective layer of uniaxial continuous material. Power reflectance of such dielectric lamellar structure was computed using RCWA theory. Angular spectra of power reflectance were subsequently used as the input to the optimization procedure in order to find effective indices of refraction. The spectral dependence of effective parameters was obtained as well as the fill factor dependence. The results were confronted with the simple model of effective permitivitties. The results support the idea, that the effective media models should include the role of the substrate.

Paper Details

Date Published: 7 April 2004
PDF: 4 pages
Proc. SPIE 5445, Microwave and Optical Technology 2003, (7 April 2004); doi: 10.1117/12.560098
Show Author Affiliations
Dalibor Ciprian, Technical Univ. of Ostrava (Czech Republic)
Jaromir Pistora, Technical Univ. of Ostrava (Czech Republic)


Published in SPIE Proceedings Vol. 5445:
Microwave and Optical Technology 2003
Jaromir Pistora; Kamil Postava; Miroslav Hrabovsky; Banmali S. Rawat, Editor(s)

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