Share Email Print

Proceedings Paper

Use of acoustic waves in x-ray topography of silicon crystals
Author(s): S. N. Novikov; D. G. Fedortsov; V. V. Dovganyuk
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The influence of transverse ultrasonic wave parameters on the diffraction contrast forming on X-ray section topographs for microdefects and dislocations was investigated by the numerical solution of Takagi's equations system. The corresponding changes of integral characteristics of structural imperfections for real crystals were analyzed also.

Paper Details

Date Published: 4 June 2004
PDF: 7 pages
Proc. SPIE 5477, Sixth International Conference on Correlation Optics, (4 June 2004); doi: 10.1117/12.560005
Show Author Affiliations
S. N. Novikov, Chernivtsi National Univ. (Ukraine)
D. G. Fedortsov, Chernivtsi National Univ. (Ukraine)
V. V. Dovganyuk, Chernivtsi National Univ. (Ukraine)

Published in SPIE Proceedings Vol. 5477:
Sixth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

© SPIE. Terms of Use
Back to Top