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Proceedings Paper

Compact reconnaissance imaging spectrometer for Mars (CRISM): characterization results for instrument and focal plane subsystems
Author(s): Peter R. Silverglate; Kevin J. Heffernan; Peter D. Bedini; John D. Boldt; Peter J. Cavender; Tech H. Choo; Edward Hugo Darlington; Erik T. Donald; Melissa J. Fasold; Dennis E. Fort; Reid S. Gurnee; Allen T. Hayes; John R. Hayes; James B. Hemler; David C. Humm; Noam R. Izenberg; Robert E. Lee; William Jeffrey Lees; David A. Lohr; Scott L. Murchie; Graham A. Murphy; Ralph Alan Reiter; Edigio Rossano; Gordon G. Seagrave; Edward D. Schaefer; Kim Strohbehn; Howard W. Taylor; Patrick L. Thompson; Barry E. Tossman; Paul Wilson; Mark S. Robinson; Robert Green; Steven E. Mitchell
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Paper Abstract

The Compact Reconnaissance Imaging Spectrometer for Mars (CRISM) will launch in 2005 on the Mars Reconnaissance Orbiter (MRO) mission, with its primary science objective to characterize sites with aqueous mineral deposits hyperspectrally at high spatial resolution. CRISM’s two Offner relay spectrometers share a single entrance slit with a dichroic beamsplitter. The IR focal plane contains a 640 (spatial) x 480 (spectral) HgCdTe FPA with a 980 nm to 3960 nm spectral bandpass. It is cooled to 110 K to minimize dark current, and coupled to a 28 mm long cold shield to minimize thermal background. The spectrometer housing is cooled to -90 C for the same reason. A three-zone IR filter consisting of two broadband filters and a linear variable filter overlays the IR focal plane, eliminating multiple grating orders and providing additional attenuation of the thermal background. The visible focal plane contains a 640 (spatial) x 480 (spectral) silicon photodiode array, with a 380-1050 nm spectral bandpass occupying approximately 106 rows of the detector. A two-zone filter comprised of two different Schott glasses eliminates multiple grating orders. The two focal planes together cover 544 spectral channels with a dispersion of 6.55 nm/channel in the VNIR and 6.63 nm/channel in the IR. The optics and focal planes are gimbaled, and a pre-programmed slew can be used to remove groundtrack motion while superimposing a scan across a target. CRISM will operate in two basic modes: a scanning, high resolution mode to hyperspectrally map small, targeted areas of high scientific interest, and a fixed, nadir-pointed, lower resolution pixel-binned mode using selected wavelength channels to obtain near-global coverage to find targets. Preliminary performance of the CRISM instrument is presented, and is compared with prior system design predictions.

Paper Details

Date Published: 21 October 2004
PDF: 13 pages
Proc. SPIE 5563, Infrared Systems and Photoelectronic Technology, (21 October 2004); doi: 10.1117/12.559882
Show Author Affiliations
Peter R. Silverglate, Johns Hopkins Univ. Applied Physics Lab. (United States)
Kevin J. Heffernan, Johns Hopkins Univ. Applied Physics Lab. (United States)
Peter D. Bedini, Johns Hopkins Univ. Applied Physics Lab. (United States)
John D. Boldt, Johns Hopkins Univ. Applied Physics Lab. (United States)
Peter J. Cavender, Johns Hopkins Univ. Applied Physics Lab. (United States)
Tech H. Choo, Johns Hopkins Univ. Applied Physics Lab. (United States)
Edward Hugo Darlington, Johns Hopkins Univ. Applied Physics Lab. (United States)
Erik T. Donald, Johns Hopkins Univ. Applied Physics Lab. (United States)
Melissa J. Fasold, Johns Hopkins Univ. Applied Physics Lab. (United States)
Dennis E. Fort, Johns Hopkins Univ. Applied Physics Lab. (United States)
Reid S. Gurnee, Johns Hopkins Univ. Applied Physics Lab. (United States)
Allen T. Hayes, Johns Hopkins Univ. Applied Physics Lab. (United States)
John R. Hayes, Johns Hopkins Univ. Applied Physics Lab. (United States)
James B. Hemler, Johns Hopkins Univ. Applied Physics Lab. (United States)
David C. Humm, Johns Hopkins Univ. Applied Physics Lab. (United States)
Noam R. Izenberg, Johns Hopkins Univ. Applied Physics Lab. (United States)
Robert E. Lee, Johns Hopkins Univ. Applied Physics Lab. (United States)
William Jeffrey Lees, Johns Hopkins Univ. Applied Physics Lab. (United States)
David A. Lohr, Johns Hopkins Univ. Applied Physics Lab. (United States)
Scott L. Murchie, Johns Hopkins Univ. Applied Physics Lab. (United States)
Graham A. Murphy, Johns Hopkins Univ. Applied Physics Lab. (United States)
Ralph Alan Reiter, Johns Hopkins Univ. Applied Physics Lab. (United States)
Edigio Rossano, Johns Hopkins Univ. Applied Physics Lab. (United States)
Gordon G. Seagrave, Johns Hopkins Univ. Applied Physics Lab. (United States)
Edward D. Schaefer, Johns Hopkins Univ. Applied Physics Lab. (United States)
Kim Strohbehn, Johns Hopkins Univ. Applied Physics Lab. (United States)
Howard W. Taylor, Johns Hopkins Univ. Applied Physics Lab. (United States)
Patrick L. Thompson, Johns Hopkins Univ. Applied Physics Lab. (United States)
Barry E. Tossman, Johns Hopkins Univ. Applied Physics Lab. (United States)
Paul Wilson, Johns Hopkins Univ. Applied Physics Lab. (United States)
Mark S. Robinson, Northwestern Univ. (United States)
Robert Green, Jet Propulsion Lab. (United States)
California Institute of Technology (United States)
Steven E. Mitchell, Univ. of Maryland/College Park (United States)


Published in SPIE Proceedings Vol. 5563:
Infrared Systems and Photoelectronic Technology
C. Bruce Johnson; Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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