Share Email Print
cover

Proceedings Paper

Computation of internal reflection of light-scattering layer
Author(s): Oleg N. Kozakov; N. L. Kirsh; T. M. Kunetskaya
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Kubelka-Munk model is widely applied to the investigation of light-scattering layers of various kinds, such as biotissues, leaves of plants, paints etc. Disadvantage of this model is that it does not take into account the real interfaces. As a result, the measured magnitudes of optical characteristics must to be corrected. In part, one must to know the coefficient of internal reflection of light-scattering layer. In this paper we propose the method for evaluation of this parameter by statistical simulation and present the results of computation.

Paper Details

Date Published: 4 June 2004
PDF: 6 pages
Proc. SPIE 5477, Sixth International Conference on Correlation Optics, (4 June 2004); doi: 10.1117/12.559838
Show Author Affiliations
Oleg N. Kozakov, Chernivtsi National Univ. (Ukraine)
N. L. Kirsh, Chernivtsi National Univ. (Ukraine)
T. M. Kunetskaya, Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 5477:
Sixth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

© SPIE. Terms of Use
Back to Top