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Proceedings Paper

The role of adhesion forces in nanoscale measurements of the conductive properties of organic surfaces using conductive probe AFM
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Paper Abstract

Electronic and mechanical studies of metal-molecules-metal junction have been accomplished to evaluate how bias-induced adhesion forces influence the charge transport efficiency of these junctions. The conducting probe atomic force microscope (CP-AFM) measures the current through an organic film sandwiched between two metal electrodes as a function of the tip-sample separation simultaneously with detection of the force between the probe and the surface. By applying a voltage between the sample and the tip, an attractive electrostatic capacitance force is added to the adhesion force. This paper describes probe-sample capacitance forces in conducting probe (CP) microscopy of polythiophene and alkanethiol monolayers, both theoretically and experimentally. The importance of taking into account an offset in the interaction force determined by the bias-induced adhesion force in the electronic measurements is demonstrated using current-voltage (I-V) characteristics of the polythiophene monolayer and the dependence of the adhesion force as a function of applied tip bias.

Paper Details

Date Published: 14 October 2004
PDF: 8 pages
Proc. SPIE 5513, Physical Chemistry of Interfaces and Nanomaterials III, (14 October 2004); doi: 10.1117/12.559718
Show Author Affiliations
Alexei V. Tivanski, Univ. of Pittsburgh (United States)
Gilbert C. Walker, Univ. of Pittsburgh (United States)


Published in SPIE Proceedings Vol. 5513:
Physical Chemistry of Interfaces and Nanomaterials III
Gregory V. Hartland; Xiao-Yang Zhu, Editor(s)

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