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Proceedings Paper

Tomographic x-ray absorption spectroscopy
Author(s): Christian G. Schroer; Marion Kuhlmann; Til Florian Gunzler; Bruno Lengeler; Matthias Richwin; Bernd Griesebock; Dirk Lutzenkirchen-Hecht; Ronald Frahm; Eric Ziegler; Ali Mashayekhi; Dean Haeffner; Jan-Dierk Grunwaldt; Alfons Baiker
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Paper Abstract

Hard x-ray absorption spectroscopy is combined with scanning microtomography to reconstruct full near edge spectra of an elemental species at each location on an arbitrary virtual section through a sample. These spectra reveal the local concentrations of different chemical compounds of the absorbing element inside the sample and give insight into the oxidation state, the local atomic structure, and the local projected free density of states. The method is implemented by combining a quick scanning monochromator and data acquisition system with a scanning microprobe setup based on refractive x-ray lenses. The full XANES spectra reconstructed at each point of the tomographic slice allow to detect slight variations in concentrations of chemical compounds, such as metallic and monovalent copper. The method is applied to the analysis of a heterogeneous catalyst.

Paper Details

Date Published: 26 October 2004
PDF: 9 pages
Proc. SPIE 5535, Developments in X-Ray Tomography IV, (26 October 2004); doi: 10.1117/12.559706
Show Author Affiliations
Christian G. Schroer, Aachen Univ. (Germany)
HASYLAB/Deutches Electronen-Synchrotron (Germany)
Marion Kuhlmann, Aachen Univ. (Germany)
Til Florian Gunzler, Aachen Univ. (Germany)
Bruno Lengeler, Aachen Univ. (Germany)
Matthias Richwin, Bergische Univ. Wuppertal (Germany)
Bernd Griesebock, Bergische Univ. Wuppertal (Germany)
Dirk Lutzenkirchen-Hecht, Bergische Univ. Wuppertal (Germany)
Ronald Frahm, Bergische Univ. Wuppertal (Germany)
Eric Ziegler, European Synchrotron Radiation Facility (France)
Ali Mashayekhi, Argonne National Lab. (United States)
Dean Haeffner, Argonne National Lab. (United States)
Jan-Dierk Grunwaldt, ETH Honggerberg (Switzerland)
Alfons Baiker, ETH Honggerberg (Switzerland)

Published in SPIE Proceedings Vol. 5535:
Developments in X-Ray Tomography IV
Ulrich Bonse, Editor(s)

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