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Proceedings Paper

Moiré interferometry formulas for hard x-ray wavefront sensing
Author(s): Timm Weitkamp; A. Diaz; Bernd Nohammer; Franz Pfeiffer; Marco Stampanoni; Eric Ziegler; Christian David
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Paper Abstract

We derive mathematical relations for hard X-ray moire wavefront analysis with a grating interferometer. In particular, the first derivative of the wavefront phase profile and the local radius of curvature of the wavefront are related to the position and inclination of the observed moiré fringes.

Paper Details

Date Published: 18 October 2004
PDF: 5 pages
Proc. SPIE 5533, Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications II, (18 October 2004); doi: 10.1117/12.559695
Show Author Affiliations
Timm Weitkamp, Paul Scherrer Institut (Switzerland)
A. Diaz, Paul Scherrer Institut (Switzerland)
Bernd Nohammer, Paul Scherrer Institut (Switzerland)
Franz Pfeiffer, European Synchrotron Radiation Facility (France)
Marco Stampanoni, European Synchrotron Radiation Facility (France)
Eric Ziegler, Paul Scherrer Institut (Switzerland)
Christian David, Paul Scherrer Institut (Switzerland)


Published in SPIE Proceedings Vol. 5533:
Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications II
Ali M. Khounsary; Udo Dinger; Kazuya Ota, Editor(s)

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