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Proceedings Paper

Application of digital speckle pattern interferometry in measurement of large deformation
Author(s): Rajesh Kumar; Vikas Rathi; Saba Mirza; Chandra Shakher
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Paper Abstract

In this paper an algorithm to measure large deformations using digital speckle pattern interferometry is presented. It facilitates recording of large number of frames and can subtract them to display speckle correlation fringes with improved signal-to-noise ratio. To further improve signal-to-noise ratio a filtering scheme is also presented by using average/median filtering followed by wavelets filtering. Experimental results and analysis are presented in detail. For a typical displacement of 200 μm, error in measurement was less than 1.5 percent. Range in measurement is governed by change in scattering property of the surface of the object.

Paper Details

Date Published: 2 August 2004
PDF: 5 pages
Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); doi: 10.1117/12.559560
Show Author Affiliations
Rajesh Kumar, Indian Institute of Technology Delhi (India)
Vikas Rathi, Indian Institute of Technology Delhi (India)
Saba Mirza, Indian Institute of Technology Delhi (India)
Chandra Shakher, Indian Institute of Technology Delhi (India)


Published in SPIE Proceedings Vol. 5532:
Interferometry XII: Applications
Wolfgang Osten; Erik Novak, Editor(s)

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