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Proceedings Paper

Method for continuous end standard measurement utilizing laser interferometer
Author(s): Kai-Yu Cheng; Chung-Chi Tang; Wei-Cheng Chang; Chao-Jung Chen; Tsai-Fu Wu; Jung-Tsung Chou
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Paper Abstract

For dimensional researches and applications, the end standard measurements are the popular subjects in high precision standard systems or instruments. In general, the gauge blocks are the representative of the end standards. The universal measurement machines (UMM) are usually utilized for the dimensional length of gauge blocks. However, for measuring the dimensional lengths of test gauge blocks (TGBs), they should be compared with the same lengths of the master gauge blocks (MGBs). Thus, there are different lengths of the MGBs needed to be prepared and the measuring procedures are usually very time consuming. In order to lower the cost of procurement and maintenance of MGBs, a continuous end standard measurement system (CESMS) was built for many different test ranges of TGBs. The features of the CESMS included at least one gauge block, the LVDT probes for positioning, the real lengths of the TGBs measured from the display value of the laser interferometer, and total procedures controlled by automation software. All of these parts were integrated onto a large platform and its moving carriage could travel up to 1.2-meter in distance. Within these ranges, the CESMS could measure different dimensional lengths of the TGBs and many pieces at the same time. The CESMS utilized the laser interferometer to acquire the accurate display values between two ends when the LVDT probe was touched and triggered the automation software to record. Owing to the recommended radiation of laser head, the CESMS could be traced to the meter, SI unit. Furthermore, the experiment results showed that the comparison results of certificated gauge block at 800 mm suited for calibration certificate by PTB.

Paper Details

Date Published: 2 August 2004
PDF: 8 pages
Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); doi: 10.1117/12.559455
Show Author Affiliations
Kai-Yu Cheng, Industrial Technology Research Institute (Taiwan)
Chung-Chi Tang, Industrial Technology Research Institute (Taiwan)
Wei-Cheng Chang, Industrial Technology Research Institute (Taiwan)
Chao-Jung Chen, Industrial Technology Research Institute (Taiwan)
Tsai-Fu Wu, Industrial Technology Research Institute (Taiwan)
Jung-Tsung Chou, Industrial Technology Research Institute (Taiwan)


Published in SPIE Proceedings Vol. 5532:
Interferometry XII: Applications
Wolfgang Osten; Erik Novak, Editor(s)

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