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Proceedings Paper

High-throughput x-ray microtomography system at the Advanced Photon Source beamline 2-BM
Author(s): Francesco De Carlo; Brian Tieman
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Paper Abstract

X-ray microtomography is rapidly becoming the tool of choice for three-dimensional (3D) imaging of thick structures at the 1-10 µm scale. The fast microtomography system developed at beamline 2-BM of the Advanced Photon Source (APS) is a new class of instrument offering near video-rate acquisition of tomographic data combined with pipelined processing, reconstruction, and visualization. This system can acquire and reconstruct 720 projections (1024x1024 pixels) at 0.25 deg angular increments in under 5 min using a dedicated 32-node computer cluster. At this throughput, hundreds of specimens can be imaged in a 24 h experiment. Alternatively, time-dependent 3D sample evolution can be studied on practical time scales. In this work, we present the current instrument status and the most recent application.

Paper Details

Date Published: 26 October 2004
PDF: 8 pages
Proc. SPIE 5535, Developments in X-Ray Tomography IV, (26 October 2004); doi: 10.1117/12.559223
Show Author Affiliations
Francesco De Carlo, Argonne National Lab. (United States)
Brian Tieman, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 5535:
Developments in X-Ray Tomography IV
Ulrich Bonse, Editor(s)

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