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Proceedings Paper

Radiation pyrometric measurements with distance to the source effect and size-of-the-source effect corrections
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Paper Abstract

Radiation pyrometers are widely used in industries and laboratories for non-contact temperature measurement of objects. In the case of very accurate pyrometry, the measurements are affected by two effects, namely, the size-of-source effect (SSE) and the distance to the source effect (DE). The lack of accuracy in the measurements due to the SSE is associated to variations in the size of the object for a fixed measuring distance, whereas for the DE is associated to variations of the measuring distance for a fixed size of the object. In this work we present a numerical method that can be used for the calculation of corrections for both effects. In this case the method is applied to a lensless double aperture pyrometer. The method is based on the theory of partial coherence for the calculation of the energy transport through the pyrometer. The corrections can be made for sources of any size and shape and for any distance. In this case we consider sources of circular shape given our black body radiators. We present experimental results that confirm our numerical calculations.

Paper Details

Date Published: 15 October 2004
PDF: 8 pages
Proc. SPIE 5526, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control, (15 October 2004); doi: 10.1117/12.558959
Show Author Affiliations
Juan Carlos Solorio-Leyva, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Jose Guadalupe Suarez-Romero, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Juan B. Hurtado-Ramos, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Eduardo Tepichin-Rodriguez, Instituto Nacional de Astrofisica Optica y Electronica (Mexico)
Jose-German Cortes-Reynoso, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)


Published in SPIE Proceedings Vol. 5526:
Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control
John C. Fleming; Philip T. C. Chen; Michael G. Dittman, Editor(s)

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