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Proceedings Paper

A new method for feature extraction and matching using the energy of Fourier basis
Author(s): M. C. Prakash; G. V. Prabhakara Rao; K. S. Sridharan
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Paper Abstract

In this paper we have proposed a method, called the Fourier Feature Extractor (FFE) that relies on orthogonal sinusoidal bases for feature extraction. The response generated on projecting image intensity windows onto these sinusoidal bases is used for extract features. We use energy of Fourier basis to capture the intensity change around pixel points. By interpreting the amplitude values of Fourier basis we distinguish different interest points like, edge-point, corner-point, T-junctions. The method offers the flexibility to choose different kinds of interest points depending on the choice of basis function and energy values. The feature points detected are found to be geometrically stable under different transformations. The Fourier measure assigned during extraction can be used for matching of feature points between images and this make registration efficient.

Paper Details

Date Published: 2 November 2004
PDF: 8 pages
Proc. SPIE 5558, Applications of Digital Image Processing XXVII, (2 November 2004); doi: 10.1117/12.558855
Show Author Affiliations
M. C. Prakash, Sri Sathya Sai Institute of Higher Learning (India)
G. V. Prabhakara Rao, Sri Sathya Sai Institute of Higher Learning (India)
Rajeev Gandhi Memorial College of Engineering and Technology (India)
K. S. Sridharan, Sri Sathya Sai Institute of Higher Learning (India)


Published in SPIE Proceedings Vol. 5558:
Applications of Digital Image Processing XXVII
Andrew G. Tescher, Editor(s)

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