Share Email Print
cover

Proceedings Paper

Erasure characteristics of off-Bragg readout during nonvolatile holographic storage in doubly doped LiNbO3 crystals
Author(s): Dean Liu; Liren Liu; Qianmin Dong; Zhu Luan; Yu Zhou
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper the erasure characteristics with different readout conditions, especially off-Bragg readout, during nonvolatile holographic storage in doubly doped LiNbO3 crystals are investigated. The results show that off-Bragg readout by red beam can achieve modest diffraction efficiency while self-enhancement readout gets highest and self-depletion readout has lest diffraction efficiency. During erasing phase, the fast erasure case is that off-Bragg red beam and ultraviolet light are simultaneously used for illumination. It is indicated that the greatest effect on the erasure of the former recorded gratings during multiplexing holograms is the recording of the others gratings, and new recording schedule during multiplexing technique should be considered according to off-Bragg erasing. The experimental results are well verified by theoretical simulation basing on two-center material equations and two beam coupling equations.

Paper Details

Date Published: 22 October 2004
PDF: 5 pages
Proc. SPIE 5560, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications X, (22 October 2004); doi: 10.1117/12.558847
Show Author Affiliations
Dean Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Liren Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Qianmin Dong, Shanghai Institute of Optics and Fine Mechanics (China)
Zhu Luan, Shanghai Institute of Optics and Fine Mechanics (China)
Yu Zhou, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 5560:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications X
Francis T. S. Yu; Ruyan Guo; Shizhuo Yin, Editor(s)

© SPIE. Terms of Use
Back to Top