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Proceedings Paper

Two-point diffraction interferometer for absolute distance measurement
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Paper Abstract

We describe a novel method of measuring absolute distances by using a two-point diffraction source specially devised to generate two high quality spherical waves simultaneously with a small lateral offset. Interference of the generated two spherical waves produces a unique ellipsoidal phase distribution in the measurement space. A partial map of the resulted interference phase field is sampled and fitted to a geometric model of multilateration that allows absolute-distance measurements to be performed without 2π-ambiguity. The partial phase map may be obtained by use of either homodyne or heterodyne phase measuring technique. Test results demonstrate that high precision with 1 part in 106 uncertainty can be achieved over 1 meter distance range.

Paper Details

Date Published: 2 August 2004
PDF: 8 pages
Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); doi: 10.1117/12.558834
Show Author Affiliations
Seung-Woo Kim, Korea Advanced Institute of Science and Technology (South Korea)
Hyug-Gyo Rhee, Korea Advanced Institute of Science and Technology (South Korea)
Jiyoung Joo, Korea Advanced Institute of Science and Technology (South Korea)
Young Jin Kim, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 5531:
Interferometry XII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

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