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Proceedings Paper

Nanocrystal superlattice imaging by atomic force microscopy
Author(s): Peter K. Stoimenov; Savka I. Stoeva; B.L.V. Prasad; Christopher M. Sorensen; Kenneth J. Klabunde
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Paper Abstract

Applicability of Atomic Force Microscopy (AFM) for structural characterization of nanocrystal superlattices is demonstrated on high-resolution imaging of superlattices formed by thiol stabilized gold nanoparticles on carbon coated and hydrophobic supports. Thin (<1nm) uniform coating of the samples with metal film before imaging was found to eliminate the undesirable effects of tip-sample interaction. Size and interparticle spacing are in excellent agreement with transmission electron microscopy results. AFM can be used as a complementary technique for nanocrystal superlattice structural characterization providing possibilities for crystal growth investigation on a variety of supports of practical interest and high resolution of the surface structure of superlattice structures.

Paper Details

Date Published: 14 October 2004
PDF: 11 pages
Proc. SPIE 5513, Physical Chemistry of Interfaces and Nanomaterials III, (14 October 2004); doi: 10.1117/12.558429
Show Author Affiliations
Peter K. Stoimenov, Kansas State Univ. (United States)
Savka I. Stoeva, Kansas State Univ. (United States)
B.L.V. Prasad, Kansas State Univ. (United States)
Christopher M. Sorensen, Kansas State Univ. (United States)
Kenneth J. Klabunde, Kansas State Univ. (United States)

Published in SPIE Proceedings Vol. 5513:
Physical Chemistry of Interfaces and Nanomaterials III
Gregory V. Hartland; Xiao-Yang Zhu, Editor(s)

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