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Proceedings Paper

Design and manufacture of a large-aperture wavefront sensor
Author(s): Richard A. Hutchin; Oberdan W. Otto; Alan Wertheimer
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Paper Abstract

A compact, low-cost wavefront sensor has been demonstrated to measure dynamic disturbances in 1-3 m diameter optical systems. With 448 subapertures and 4 KHz frame rate, it can measure disturbances up to 2 KHz at a level of 1/3800 waves rms at 0.65 μm. It also has a linear dynamic range of 3 X 106:1 for ease of alignment. The principles of operation and test data are presented for the subaperture sensors (called NanoTrackers), which are lateral shearing interferometers capable of measuring tilt to 1.7 nanoradians rms at 8 µW of input power as well as phasing for segmented optical systems to 75 picometers rms (at 4 KHz).

Paper Details

Date Published: 12 October 2004
PDF: 12 pages
Proc. SPIE 5553, Advanced Wavefront Control: Methods, Devices, and Applications II, (12 October 2004); doi: 10.1117/12.558375
Show Author Affiliations
Richard A. Hutchin, Optical Physics Co. (United States)
Oberdan W. Otto, Optical Physics Co. (United States)
Alan Wertheimer, Eastman Kodak Co. (United States)

Published in SPIE Proceedings Vol. 5553:
Advanced Wavefront Control: Methods, Devices, and Applications II
John D. Gonglewski; Mark T. Gruneisen; Michael K. Giles, Editor(s)

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