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Proceedings Paper

New aspects of narrow bandpass optical filters for DWDM
Author(s): Kamil Postava; Jaromir Pistora; M. Kojima; K. Kikuchi; K. Endo; Tomuo Yamaguchi
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Paper Abstract

Several aspects of thickness monitoring and turning-point prediction during deposition of the narrow band pass optical filters (NBPF) for dense-wavelength-division-multiplexing (DWDM) applications are discussed. Simplification of the method using a recurrent approach, relative transmittance fitting is presented. Partial coherence, effects of monochromator bandpass and divergence of the testing incident beam are also included. We show that the partial coherence effects in thin film structure are significant and can not be neglected. The proposed method is applicable for precise thickness monitoring and deposition control of any complex multilayer coating.

Paper Details

Date Published: 7 April 2004
PDF: 6 pages
Proc. SPIE 5445, Microwave and Optical Technology 2003, (7 April 2004); doi: 10.1117/12.558089
Show Author Affiliations
Kamil Postava, Technical Univ. of Ostrava (Czech Republic)
Jaromir Pistora, Technical Univ. of Ostrava (Czech Republic)
M. Kojima, Tech-I Co., Ltd. (Japan)
K. Kikuchi, Tech-I Co., Ltd. (Japan)
K. Endo, Tech-I Co., Ltd. (Japan)
Tomuo Yamaguchi, Shizuoka Univ. (Japan)


Published in SPIE Proceedings Vol. 5445:
Microwave and Optical Technology 2003
Jaromir Pistora; Kamil Postava; Miroslav Hrabovsky; Banmali S. Rawat, Editor(s)

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