Share Email Print
cover

Proceedings Paper

Method of circular aperture sampling for wavefront analysis
Author(s): Mingli Zhang; Liren Liu; Zhu Luan; Lingyu Wan; Lijuan Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

It is required for the laser communication that laser beam transmitted from the optical terminal must be highly parallel. Optical diffraction limit angle is the minimum divergence the beam can obtain while limited by the definite aperture under ideal conditions, here wavefront still has an error of 0.3 wave. This paper introduces a new method for wavefront analysis. In this method a circular aperture diaphragm used to sample the tested wavefront, a focusing lens, a microscope objective and a fiber optic probe are arranged coaxial. Axial intensity profile behind the focusing lens is plotted by registering the positions of the microscope objective on the axis and the readings of the radiometer. The sampled wavefront height is estimated from the distance between two symmetrical positions along the axis where the intensity is zero. The tested wavefront height is calculated from the sampled wavefront height. The theory and the simulation results are given. It can be applied in coarse measurement of any wavelength laser wavefront. Due to simplicity of the method and its low cost, it is a promising method for checking the collimation of a laser beam.

Paper Details

Date Published: 20 October 2004
PDF: 6 pages
Proc. SPIE 5550, Free-Space Laser Communications IV, (20 October 2004); doi: 10.1117/12.557907
Show Author Affiliations
Mingli Zhang, Shanghai Institute of Optics and Fine Mechanics (China)
Liren Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Zhu Luan, Shanghai Institute of Optics and Fine Mechanics (China)
Lingyu Wan, Shanghai Institute of Optics and Fine Mechanics (China)
Lijuan Wang, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 5550:
Free-Space Laser Communications IV
Jennifer C. Ricklin; David G. Voelz, Editor(s)

© SPIE. Terms of Use
Back to Top