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Proceedings Paper

New developments in synchrotron-based microtomography
Author(s): Marco Stampanoni; Rafael Abela; Gunther Borchert; Bruce D. Patterson
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Paper Abstract

State-of-the-art synchrotron-based microtomography devices have nowadays to fulfill very stringent requirements in term of spatial resolution, detection efficiency and data throughput. The most used detection system is based on collecting the light produced by a thin scintillation screen with microscope optics and conveying it to a high-performance charge coupled device (CCD) camera. With the chip-size of currently available CCDs installed at high brilliance sources like the Swiss Light Source (SLS) raw data are produced at rate of gigabyte/minute. It is crucial therefore to provide the necessary infrastructure to be able to post-process the data in real time, and provide to the user 3D information immediately after the end of the scan. The visible-light-based detection system is intrinsically limited by scintillation properties, optical coupling and CCD granularity to a practical limit of about 1 micron spatial resolution and efficiency of a few percent. A novel detector, called Bragg magnifier, is one of the techniques recently proposed to efficiently trespass the micrometer barrier. It exploits two-dimensional asymmetric Bragg diffraction from flat crystals to produce X-ray images with magnification factors up to 150x150 and pixel sizes less than 100x100 nm2. The infrastructure devoted to microtomography at the SLS is described, as well as some very promising experiments. The layout of a novel, tomography dedicated beamline is also presented.

Paper Details

Date Published: 26 October 2004
PDF: 13 pages
Proc. SPIE 5535, Developments in X-Ray Tomography IV, (26 October 2004); doi: 10.1117/12.557870
Show Author Affiliations
Marco Stampanoni, Paul Scherrer Institut (Switzerland)
Rafael Abela, Paul Scherrer Institut (Switzerland)
Gunther Borchert, Technische Univ. Munchen (Germany)
Bruce D. Patterson, Paul Scherrer Institut (Switzerland)

Published in SPIE Proceedings Vol. 5535:
Developments in X-Ray Tomography IV
Ulrich Bonse, Editor(s)

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