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Proceedings Paper

High-resolution radiation image storage screens
Author(s): Lev Nagli; Igor Friedland
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Paper Details

Date Published:
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Proc. SPIE 5535, Developments in X-Ray Tomography IV, ; doi: 10.1117/12.557575
Show Author Affiliations
Lev Nagli, Tel Aviv Univ. (Israel)
Igor Friedland, Electro-Optics Industries Ltd. (Israel)


Published in SPIE Proceedings Vol. 5535:
Developments in X-Ray Tomography IV
Ulrich Bonse, Editor(s)

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