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Proceedings Paper

Design of an elliptical crystal spectrometer for diagnosing pulsed plasma x-ray
Author(s): Xianxin Zhong; Xiancai Xiong; Shali Xiao; Yu Chen; Jiayu Qian; Jie Gao
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Paper Abstract

A novel elliptical crystal spectrometer has been designed and manufactured to diagnose pulsed plasmas x-ray. The light path is designed according to the elliptical focusing property. The spectrometer is composed of the elliptical x-ray analyzer, the alignment devices, the vacuum system, the ports of the spectral detectors for x-ray CCD camera and x-ray streak camara, the supporting base, and the adapting flange to the target chamber. The target-shooting experiment was performed at the XG-Π and SGΠlaser facilities for testing the spectrometer. The optical system, optoelectronic machinery system, experimental results are discussed in this paper.

Paper Details

Date Published: 22 October 2004
PDF: 7 pages
Proc. SPIE 5524, Novel Optical Systems Design and Optimization VII, (22 October 2004); doi: 10.1117/12.557423
Show Author Affiliations
Xianxin Zhong, Chongqing Univ. (China)
Xiancai Xiong, Chongqing Univ. (China)
Shali Xiao, Chongqing Univ. (China)
Yu Chen, Univ. of Southern California (United States)
Jiayu Qian, Chongqing Univ. (China)
Jie Gao, Chongqing Univ. (China)


Published in SPIE Proceedings Vol. 5524:
Novel Optical Systems Design and Optimization VII
Jose M. Sasian; R. John Koshel; Paul K. Manhart; Richard C. Juergens, Editor(s)

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