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Proceedings Paper

A new method to measure the signal quality for high-density recording systems
Author(s): Eing-Seob Cho; Jae-Wook Lee; Junghyun Lee; Eun-Jin Ryu; Maxim Konakov; Jae-Seong Shim; Hyun-Soo Park
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Paper Abstract

In this paper, a new method using an eye pattern is proposed to measure the signal quality for high-density recording systems. The experiment shows that the new method has a strong relation to SER of the system using PRML algorithm.

Paper Details

Date Published: 9 September 2004
PDF: 7 pages
Proc. SPIE 5380, Optical Data Storage 2004, (9 September 2004); doi: 10.1117/12.557115
Show Author Affiliations
Eing-Seob Cho, Samsung Advanced Institute of Technology (South Korea)
Jae-Wook Lee, Samsung Advanced Institute of Technology (South Korea)
Junghyun Lee, Samsung Advanced Institute of Technology (South Korea)
Eun-Jin Ryu, Samsung Advanced Institute of Technology (South Korea)
Maxim Konakov, Samsung Advanced Institute of Technology (South Korea)
Jae-Seong Shim, Samsung Electronics Co., Ltd. (South Korea)
Hyun-Soo Park, Samsung Electronics Co., Ltd. (South Korea)


Published in SPIE Proceedings Vol. 5380:
Optical Data Storage 2004
B. V. K. Vijaya Kumar; Hiromichi Kobori, Editor(s)

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