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Proceedings Paper

In-situ time-resolved reflectivity monitoring and control of vertically aligned multiwall carbon nanotube array growth during chemical vapor depostion
Author(s): David B. Geohegan; Alexander A. Puretzky; J. Howe; I. Ivanov; Stephen Jesse; Gyula Eres
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Proc. SPIE 5339, Photon Processing in Microelectronics and Photonics III, ; doi: 10.1117/12.556738
Show Author Affiliations
David B. Geohegan, Oak Ridge National Lab. (United States)
Alexander A. Puretzky, Univ. of Tennessee (United States)
J. Howe, Oak Ridge National Lab. (United States)
I. Ivanov, Oak Ridge National Lab. (United States)
Stephen Jesse, Univ. of Tennessee/Knoxville (United States)
Gyula Eres, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 5339:
Photon Processing in Microelectronics and Photonics III
Jan J. Dubowski; David B. Geohegan; Frank Träger; Peter R. Herman; Jim Fieret; Alberto Pique; Tatsuo Okada; Friedrich G. Bachmann; Willem Hoving; Kunihiko Washio; Xianfan Xu, Editor(s)

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