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Proceedings Paper

Flaw detection using temporal speckle pattern interferometry and thermal waves
Author(s): Guillermo H. Kaufmann; Matias R. Viotti; Gustavo E. Galizzi
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Paper Abstract

This paper presents a temporal speckle pattern interferometry (TSPI) system which uses thermal waves to detect internal defects. The system allows the measurement of out-of-plane thermoelastic displacements generated when a specimen is locally heated with a temporally modulated CO2 laser. The defects can be detected by observing the perturbations which appear in the induced displacement field. Displacements are determined from the calculation of the optical phase distribution using a temporal phase shifting method and temporal phase unwrapping. The description of the TSPI system is followed by the presentation of experimental results that demonstrate that the detectability of certain type of flaws is improved by the use of thermal waves.

Paper Details

Date Published: 2 August 2004
PDF: 8 pages
Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); doi: 10.1117/12.555767
Show Author Affiliations
Guillermo H. Kaufmann, Instituto de Fisica Rosario (Argentina)
Univ. Nacional de Rosario (Argentina)
Matias R. Viotti, Instituto de Fisica Rosario (Argentina)
Gustavo E. Galizzi, Instituto de Fisica Rosario (Argentina)


Published in SPIE Proceedings Vol. 5532:
Interferometry XII: Applications
Wolfgang Osten; Erik Novak, Editor(s)

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