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Proceedings Paper

Physical model for near-field scattering and manipulation
Author(s): Djenan Ganic; Xiaosong Gan; Min Gu
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Paper Abstract

We present a physical model for the conversion of the evanescent photons into propagating photons detectable by an imaging system. The conversion mechanism consists of two physical processes, near-field Mie scattering enhanced by morphology dependant resonance and vectorial diffraction. For dielectric probe particles, these two processes lead to the formation of an interference-like pattern in the far-field of a collecting objective. The detailed knowledge of the far-field structure of converted evanescent photons is extremely important for designing novel detection systems. The model is also applicable for determination of the near-field force exerted on small particles situated in an evanescent field. This model should find broad applications in near-field imaging, optical nanometry and near-field metrology.

Paper Details

Date Published: 18 October 2004
PDF: 8 pages
Proc. SPIE 5514, Optical Trapping and Optical Micromanipulation, (18 October 2004); doi: 10.1117/12.555746
Show Author Affiliations
Djenan Ganic, Swinburne Univ. of Technology (Australia)
Xiaosong Gan, Swinburne Univ. of Technology (Australia)
Min Gu, Swinburne Univ. of Technology (Australia)


Published in SPIE Proceedings Vol. 5514:
Optical Trapping and Optical Micromanipulation
Kishan Dholakia; Gabriel C. Spalding, Editor(s)

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