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Proceedings Paper

Optical diffraction strain sensor
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Paper Abstract

Moire interferometry is a high sensitivity tool for deformation measurement. Micro-moire interferometry (MMI) extends this into the micron-level spatial resolution. However, the information available in both cases is in the form of a deformation map, which needs to be differentiated to determine strains. The Optical Diffraction Strain Sensor (ODSS) directly provides strain information. This is generally a point-wise approach and scanning of the specimen is necessary to obtain full-field strains. At the same time, while strains are important, the deformation map is also relevant. Hence an integrated strain sensor is proposed. To overcome the scanning, a novel sensor scheme is proposed.

Paper Details

Date Published: 2 August 2004
PDF: 6 pages
Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); doi: 10.1117/12.555654
Show Author Affiliations
Anand Krishna Asundi, Nanyang Technological Univ. (Singapore)

Published in SPIE Proceedings Vol. 5532:
Interferometry XII: Applications
Wolfgang Osten; Erik Novak, Editor(s)

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