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Proceedings Paper

Portable x-ray apparatus for stress measurements
Author(s): Vladimir I. Monin; Joaquim T. de Assis; Fernando Ruthai Pereira; Sergei A. Filippov; Tatiana Gurova; Joel R. Teodosio; H. F. Abreu
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Paper Abstract

Portable apparatus presented in this paper is an x-ray equipment permitting to carry out traditional stress determination by x-ray diffraction method both in-laboratory and in-field conditions. The portability of apparatus is achieved by construction of compact and light high voltage source coupled with special x-ray tube and using of coordinate sensitive detector. Other distinctive characteristic of apparatus is an absence of a goniometer. Special collimator and simple meter of incidence angle permit to substitute the goniometer and to carry out the stress measurements of different industrial equipments such as pipelines, tanks. Software program executes a control of measurement procedure and carries out data processing experimental results.

Paper Details

Date Published: 5 April 2004
PDF: 4 pages
Proc. SPIE 5400, Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (5 April 2004); doi: 10.1117/12.555449
Show Author Affiliations
Vladimir I. Monin, Univ. do Estado do Rio de Janeiro (Brazil)
Joaquim T. de Assis, Univ. do Estado do Rio de Janeiro (Brazil)
Fernando Ruthai Pereira, Univ. do Estado do Rio de Janeiro (Brazil)
Sergei A. Filippov, Univ. do Estado do Rio de Janeiro (Brazil)
Tatiana Gurova, Univ. Federal do Rio de Janeiro (Brazil)
Joel R. Teodosio, Univ. Federal do Rio de Janeiro (Brazil)
H. F. Abreu, Univ. Federal do Ceara (Brazil)


Published in SPIE Proceedings Vol. 5400:
Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

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