Share Email Print
cover

Proceedings Paper

A practical system for x-ray interferometry
Author(s): Richard Willingale
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

X-ray interferometry has the potential to provide imaging at ultra high angular resolutions of 100 micro arc seconds or better. However, designing a practical interferometer which fits within a reasonable envelope and that has sufficient collecting area to deliver such a performance is a challenge. A simple system which can be built using current X-ray optics capabilities and existing detector technology is described. The complete instrument would be ~20 m long and ~2 m in diameter. Simulations demonstrate that it has the sensitivity to provide high quality X-ray interferometric imaging of a large number of available targets.

Paper Details

Date Published: 11 October 2004
PDF: 12 pages
Proc. SPIE 5488, UV and Gamma-Ray Space Telescope Systems, (11 October 2004); doi: 10.1117/12.552917
Show Author Affiliations
Richard Willingale, Univ. of Leicester (United Kingdom)


Published in SPIE Proceedings Vol. 5488:
UV and Gamma-Ray Space Telescope Systems
Guenther Hasinger; Martin J. L. Turner, Editor(s)

© SPIE. Terms of Use
Back to Top