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Proceedings Paper

Elliptical varied line-space (EVLS) gratings
Author(s): Roger J. Thomas
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Paper Abstract

Imaging spectroscopy at wavelengths below 2000 Å offers an especially powerful method for studying many extended high-temperature astronomical objects, like the Sun and its outer layers. But the technology to make such measurements is also especially challenging, because of the poor reflectance of all standard materials at these wavelengths, and because the observation must be made from above the absorbing effects of the Earth's atmosphere. To solve these problems, single-reflection stigmatic spectrographs for XUV wavelengths have bee flown on several space missions based on designs with toroidal uniform line-space (TULS) or spherical varied line-space (SVLS) gratings that operate at near normal-incidence. More recently, three solar EUV/UV instruments have been selected that use toroidal varied line-space (TVLS) gratings; these are SUMI and RAISE, both sounding rocket payloads, and NEXUS, a SMEX satellite-mission. The next logical extension to such designs is the use of elliptical surfaces for varied line-space (EVLS) rulings. In fact, EVLS designs are found to provide superior imaging even at very large spectrograph magnifications and beam-speeds, permitting extremely high-quality performance in remarkably compact instrument packages. In some cases, such designs may be optimized even further by using a hyperbolic surface for the feeding telescope. The optical characteristics of two solar EUV spectrometers based on these concepts are described: EUS and EUI, both being developed as possible instruments for ESA's Solar Orbiter mission by consortia led by RAL and by MSSL, respectively.

Paper Details

Date Published: 11 October 2004
PDF: 8 pages
Proc. SPIE 5488, UV and Gamma-Ray Space Telescope Systems, (11 October 2004); doi: 10.1117/12.552131
Show Author Affiliations
Roger J. Thomas, NASA Goddard Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 5488:
UV and Gamma-Ray Space Telescope Systems
Guenther Hasinger; Martin J. L. Turner, Editor(s)

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