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Proceedings Paper

Incoming metrology of segmented x-ray mandrels at MSFC
Author(s): Mikhail V. Gubarev; Steve L. O'Dell; Thomas J. Kester; David L. Lehner; William D. Jones; Martin E. Smithers; David A. Content; Paul B. Reid
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Paper Abstract

The baseline design of the Constellation-X Spectroscopy X-ray telescope (SXT) employs segmented x-ray mirrors, to be replicated from precision mandrels. Thus far, the Constellation-X Project has procured and received three (3) flight-scale mandrels, for use in development of mirror technologies. Complementary to 30° sections of 10-m-focal-length Wolter-1 optics of diameters 1.6, 1.2, and 1.0 m, the mandrels’ primary (parabolic) and secondary (hyperbolic) optical surfaces are each 0.5-m long. In order to generate surface maps for x-ray performance predictions, NASA’s Marshall Space Flight Center (MSFC) is conducting incoming metrology. Using a combination of instruments, this metrology measures axial-slope deviations and axial profiles, slope differences, roundness, absolute radius, and micro-roughness. This paper describes the mandrels, the metrology requirements, and MSFC’s metrology instrumentation and procedures.

Paper Details

Date Published: 24 September 2004
PDF: 12 pages
Proc. SPIE 5494, Optical Fabrication, Metrology, and Material Advancements for Telescopes, (24 September 2004); doi: 10.1117/12.551902
Show Author Affiliations
Mikhail V. Gubarev, NASA Marshall Space Flight Ctr. (United States)
Steve L. O'Dell, NASA Marshall Space Flight Ctr. (United States)
Thomas J. Kester, NASA Marshall Space Flight Ctr. (United States)
David L. Lehner, NASA Marshall Space Flight Ctr. (United States)
William D. Jones, NASA Marshall Space Flight Ctr. (United States)
Martin E. Smithers, NASA Marshall Space Flight Ctr. (United States)
David A. Content, NASA Goddard Space Flight Ctr. (United States)
Paul B. Reid, Harvard-Smithsonian Ctr. for Astrophysics (United States)


Published in SPIE Proceedings Vol. 5494:
Optical Fabrication, Metrology, and Material Advancements for Telescopes
Eli Atad-Ettedgui; Philippe Dierickx, Editor(s)

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