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Proceedings Paper

VISTA data flow system survey access and curation: the WFCAM science archive
Author(s): Nigel C. Hambly; Robert G. Mann; Ian Bond; Eckhard Sutorius; Michael Read; Peredur Williams; Andrew Lawrence; James P. Emerson
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Paper Abstract

VISTA Data Flow System (VDFS) survey data products are expected to reach of order one petabyte in volume. Fast and flexible user access to these data is pivotal for efficient science exploitation. In this paper, we describe the provision for survey products archive access and curation which is the final link in the data flow system from telescope to user. Science archive development at the Wide Field Astronomy Unit of the Institute for Astronomy within the University of Edinburgh is taking a phased approach. The first phase VDFS science archive is being implemented for WFCAM, a wide-field infrared imager that has similar output to, but at a lower data rate than the VISTA camera. We describe the WFCAM Science Archive, emphasising the design approach that is intended to lead to a scalable archive system that can handle the huge volume of VISTA data.

Paper Details

Date Published: 16 September 2004
PDF: 9 pages
Proc. SPIE 5493, Optimizing Scientific Return for Astronomy through Information Technologies, (16 September 2004); doi: 10.1117/12.551623
Show Author Affiliations
Nigel C. Hambly, Royal Observatory/Univ. of Edinburgh (United Kingdom)
Robert G. Mann, Royal Observatory/Univ. of Edinburgh (United Kingdom)
National e-Science Ctr. (United Kingdom)
Ian Bond, Royal Observatory/Univ. of Edinburgh (United Kingdom)
Eckhard Sutorius, Royal Observatory/Univ. of Edinburgh (United Kingdom)
Michael Read, Royal Observatory/Univ. of Edinburgh (United Kingdom)
Peredur Williams, Royal Observatory/Univ. of Edinburgh (United Kingdom)
Andrew Lawrence, Royal Observatory/Univ. of Edinburgh (United Kingdom)
James P. Emerson, Queen Mary Univ. of London (United Kingdom)


Published in SPIE Proceedings Vol. 5493:
Optimizing Scientific Return for Astronomy through Information Technologies
Peter J. Quinn; Alan Bridger, Editor(s)

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