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Proceedings Paper

Improved techniques for measuring x-ray mass attenuation coefficients
Author(s): Martin D. de Jonge; Chanh Q. Tran; Christopher T. Chantler; Zwi Barnea
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Paper Abstract

We have applied the x-ray extended-range technique (XERT) to measure mass attenuation coefficients over one order of magnitude more accurately than previously reported in the literature. We describe here the application of the XERT to the investigation of a number of systematic effects which has enabled us to ensure that these recent measurements are free from systematic error. In particular we describe our techniques for quantifying the effects of harmonic components in the x-ray beam, scattering and fluorescence from the absorbing sample, the bandwidth of the x-ray beam, and thickness variations across the absorber.

Paper Details

Date Published: 14 October 2004
PDF: 11 pages
Proc. SPIE 5538, Optical Constants of Materials for UV to X-Ray Wavelengths, (14 October 2004); doi: 10.1117/12.549711
Show Author Affiliations
Martin D. de Jonge, Univ. of Melbourne (Australia)
Chanh Q. Tran, Univ. of Melbourne (Australia)
Christopher T. Chantler, Univ. of Melbourne (Australia)
Zwi Barnea, Univ. of Melbourne (Australia)


Published in SPIE Proceedings Vol. 5538:
Optical Constants of Materials for UV to X-Ray Wavelengths
Regina Soufli; John F. Seely, Editor(s)

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