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Proceedings Paper

Metrology system for Space Interferometry Mission's system testbed 3
Author(s): Oscar S. Alvarez-Salazar; Alireza Azizi; Yekta Gursel; George Sun; Jens Fischer; Arshak Avanesyan; John Shaw
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Paper Abstract

The Space Interferometry mission's nano-meter class System Testbed has implemented an external metrology system to monitor changes in the length & orientation of the science interferometer baseline vector, which cannot be monitored directly. The output of the system is used in real time fringe tracking of dim stars. This paper describes the external metrology system, its mathematical representation, limitations, and method for estimating the length & orientation of the science baseline vector. Simulations and current system performance are presented and discussed.

Paper Details

Date Published: 20 October 2004
PDF: 12 pages
Proc. SPIE 5491, New Frontiers in Stellar Interferometry, (20 October 2004); doi: 10.1117/12.549694
Show Author Affiliations
Oscar S. Alvarez-Salazar, Jet Propulsion Lab. (United States)
Alireza Azizi, Jet Propulsion Lab. (United States)
Yekta Gursel, Jet Propulsion Lab. (United States)
George Sun, Jet Propulsion Lab. (United States)
Jens Fischer, Jet Propulsion Lab. (United States)
Arshak Avanesyan, Jet Propulsion Lab. (United States)
John Shaw, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 5491:
New Frontiers in Stellar Interferometry
Wesley A. Traub, Editor(s)

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