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Proceedings Paper

Terahertz emission, detection, and military applications
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Paper Abstract

We review the current status of terahertz technologies, especially terahertz beam generators and detectors, which include those being developed in our laboratory. Of the many promising terahertz technologies, only a few may currently be suitable for military applications in the field, which require a high-power terahertz output and a high sensitivity in detection. In addition to these requirements, terahertz imaging for military applications demands focal-plane-arrayed detectors. Presently we are developing a terahertz source based on a modified difference-frequency technique, in which we employ an optical parametric method. We used a Nd:YAG Q-switched laser as a pump source, and LiNbO3 and GaSe crystals as the optical parametric medium. The phase matching condition is achieved by means of our new electro-optical tuning technique. Our preliminary experiments indicate that the new tuning technique enhances the terahertz-beam output power. Although the output power is currently unstable, our source can produce terahertz peak power as high as a few watts. For terahertz detection we use a Si-bolometer or an electro-optic (EO) detector. In addition to these sensors we are presently developing a new detector based on a quantum dot structure. The sensitivity of the quantum dot detector is expected to be about 10-21 W/(Hz)1/2 in terms of the noise equivalent power (NEP); this is orders of magnitude better than the sensitivity of our bolometer (10-13 W/(Hz)1/2) at 4.2 K or our EO detector (10-12 W/(Hz)1/2) at room temperature.

Paper Details

Date Published: 8 September 2004
PDF: 9 pages
Proc. SPIE 5411, Terahertz for Military and Security Applications II, (8 September 2004); doi: 10.1117/12.549334
Show Author Affiliations
Dong Ho Wu, Naval Research Lab. (United States)
Jerry R. Meyer, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 5411:
Terahertz for Military and Security Applications II
R. Jennifer Hwu; Dwight L. Woolard, Editor(s)

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