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Proceedings Paper

Is that really your Strehl ratio?
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Paper Abstract

Strehl ratio is the most commonly used metric for adaptive optics (AO) performance. It is also the most misused metric. Every Strehl ratio measurement algorithm has subtle differences that result in different measured values. This creates problems when comparing different measurements of the same AO system and even more problems when trying to compare results from different systems. To determine how much the various algorithm difference actually impacted the measured values, we created a series of simulated point spread functions (PSF). The simulated PSFs were then sent around to the various members of the project who then measured the Strehl ratio. The measurements were done blindly, with no knowledge of the true Strehl ratio. We then compared the various measurements to the truth values. Each measurement cycle turned up impacts which were further investigated in the next cycle. We present the results of our comparisons showing the scatter in measured Strehl ratios and our best recommendations for computing an accurate Strehl ratio.

Paper Details

Date Published: 25 October 2004
PDF: 12 pages
Proc. SPIE 5490, Advancements in Adaptive Optics, (25 October 2004); doi: 10.1117/12.549115
Show Author Affiliations
Lewis C. Roberts Jr., The Boeing Co. (United States)
Marshall D. Perrin, Univ. of California/Berkeley (United States)
Franck Marchis, Univ. of California/Berkeley (United States)
Anand Sivaramakrishnan, Space Telescope Science Institute (United States)
Russell B. Makidon, Space Telescope Science Institute (United States)
Julian C. Christou, Univ. of California/Santa Cruz (United States)
Bruce A. Macintosh, Lawrence Livermore National Lab. (United States)
Lisa A. Poyneer, Lawrence Livermore National Lab. (United States)
Marcos A. van Dam, Lawrence Livermore National Lab. (United States)
Mitchell Troy, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 5490:
Advancements in Adaptive Optics
Domenico Bonaccini Calia; Brent L. Ellerbroek; Roberto Ragazzoni, Editor(s)

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