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Proceedings Paper

Lightweight, compact, and affordable MW TV-format IR detectors
Author(s): Philippe M. Tribolet; Philippe Chorier; Stephane Dugalleix; Serge Magli; Patrice Fillon; Xavier Breniere
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Paper Abstract

TV/4 format (320×256) detectors are today the most produced. They have demonstrated high thermal performance and are cost effective at the mass production level. However, in response to system requirements of very high resolution, miniaturization and cost reduction, SOFRADIR is now offering full TV format (640x512) detectors with graduated levels of performances regarding pitch size and cryogenics. In particular a TV format with 15 μm pitch is offered allowing the integration of highly miniaturized cryogenics dedicated to compact systems or, depending of the applications, the upgrade of existing systems by using the same miniature cryogenics as the ones used for TV/4 format. Regarding TV format (640x512) with 15μm pitch, technological adaptations were validated at CEA-LETI/LIR (France) at the beginning of 2002. With respect to the 20μm pitch TV formats whose purpose is to offer high resolution performances in slightly modified cryogenics, this new 15μm pitch MCT TV format exhibits even higher performances in very small size optimized cryogenics in order to fit the system requirements of miniaturization and cost reduction and to achieve a cost effective production level. In this way, this 15μm pitch 640x512 MWIR MCT detectors will become, in the coming years, the most affordable large format at production level.

Paper Details

Date Published: 30 August 2004
PDF: 12 pages
Proc. SPIE 5406, Infrared Technology and Applications XXX, (30 August 2004); doi: 10.1117/12.548878
Show Author Affiliations
Philippe M. Tribolet, SOFRADIR (France)
Philippe Chorier, SOFRADIR (France)
Stephane Dugalleix, SOFRADIR (France)
Serge Magli, SOFRADIR (France)
Patrice Fillon, SOFRADIR (France)
Xavier Breniere, SOFRADIR (France)

Published in SPIE Proceedings Vol. 5406:
Infrared Technology and Applications XXX
Bjorn F. Andresen; Gabor F. Fulop, Editor(s)

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