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Proceedings Paper

Buried ion-exchanged glass waveguides featuring low birefringence with a broad range of waveguide widths
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Paper Abstract

Optical communications networks require integrated photonic components with negligible polarization dependence, which typically means that the waveguides must feature very low birefringence. Recent studies have shown that waveguides with low birefringence can be obtained, e.g., by using silica on Si waveguides and by buried ion-exchanged glass waveguides. However, many integrated photonic circuits consist of waveguides with varying widths. Therefore, low birefringence is consequently required for waveguides having different widths. This is a difficult task for most waveguide fabrication technologies. In this paper we present theoretical and experimental results on waveguide birefringence for buried silver ion-exchanged glass waveguides. We show that the waveguide birefringence is on the order of 10-6 for waveguide mask opening widths ranging from 2 to 9 μm. The measured values are in good agreement with the values calculated with our modeling software for ion-exchanged glass waveguides. This unique feature of ion-exchanged waveguides may be of significant importance in a wide variety of integrated photonic circuits requiring polarization independent operation.

Paper Details

Date Published: 18 August 2004
PDF: 7 pages
Proc. SPIE 5451, Integrated Optics and Photonic Integrated Circuits, (18 August 2004); doi: 10.1117/12.548227
Show Author Affiliations
Sanna E. Yliniemi, Optical Sciences Ctr./Univ. of Arizona (United States)
Brian R. West, Optical Sciences Ctr./Univ. of Arizona (United States)
Timo T. Aalto, VTT Technical Research Ctr. (Finland)
Pratheepan Madasamy, Optical Sciences Ctr./Univ. of Arizona (United States)
Nasser Peyghambarian, Optical Sciences Ctr./Univ. of Arizona (United States)
Seppo Honkanen, Optical Sciences Ctr./Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 5451:
Integrated Optics and Photonic Integrated Circuits
Giancarlo C. Righini; Seppo Honkanen, Editor(s)

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