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Proceedings Paper

Refraction's slacking in optoelectronic systems for positioning of elements of ecologically dangerous objects
Author(s): Sviatoslav M. Latyev; Ernst D. Pankov; Alexander V. Prokofjev; Alexander N. Tymofeev
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Paper Abstract

In this work the model of the optoelectronic measuring system with an optical equisignal zone using a two-wavelength spectral method for compensation of atmosphere refraction's influence in land stratum is considered. The optical and electrical scheme of the model, and also equations describing process of a measurement and compensation refraction's influence is resulted. These stated materials produce the model of such system.

Paper Details

Date Published: 19 February 2004
PDF: 6 pages
Proc. SPIE 5381, Lasers for Measurements and Information Transfer 2003, (19 February 2004); doi: 10.1117/12.547684
Show Author Affiliations
Sviatoslav M. Latyev, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Ernst D. Pankov, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Alexander V. Prokofjev, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Alexander N. Tymofeev, St. Petersburg Institute of Fine Mechanics and Optics (Russia)


Published in SPIE Proceedings Vol. 5381:
Lasers for Measurements and Information Transfer 2003
Vadim E. Privalov, Editor(s)

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