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Proceedings Paper

Fluctuations of complex networks: electrical properties of single-protein nanodevices
Author(s): Cecilia Pennetta; Vladimir Akimov; Eleonora Alfinito; Lino Reggiani; Gabriel Gomila
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Paper Abstract

We present for the first time a complex network approach to the study of the electrical properties of single protein devices. In particular, we consider an electronic nanobiosensor based on a G-protein coupled receptor. By adopting a coarse grain description, the protein is modeled as a complex network of elementary impedances. The positions of the alpha-carbon atoms of each amino acid are taken as the nodes of the network. The amino acids are assumed to interact electrically among them. Consequently, a link is drawn between any pair of nodes neighboring in space within a given distance and an elementary impedance is associated with each link. The value of this impedance can be related to the physical and chemical properties of the amino acid pair and to their relative distance. Accordingly, the conformational changes of the receptor induced by the capture of the ligand, are translated into a variation of its electrical properties. Stochastic fluctuations in the value of the elementary impedances of the network, which mimic different physical effects, have also been considered. Preliminary results concerning the impedance spectrum of the network and its fluctuations are presented and discussed for different values of the model parameters.

Paper Details

Date Published: 25 May 2004
PDF: 11 pages
Proc. SPIE 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II, (25 May 2004); doi: 10.1117/12.547636
Show Author Affiliations
Cecilia Pennetta, INFM, Univ. degli Studi di Leece (Italy)
Vladimir Akimov, INFM, Univ. degli Studi di Leece (Italy)
Eleonora Alfinito, INFM, Univ. degli Studi di Leece (Italy)
Lino Reggiani, INFM, Univ. degli Studi di Leece (Italy)
Gabriel Gomila, Univ. de Barcelona (Spain)


Published in SPIE Proceedings Vol. 5472:
Noise and Information in Nanoelectronics, Sensors, and Standards II
Janusz M. Smulko; Yaroslav Blanter; Mark I. Dykman; Laszlo B. Kish, Editor(s)

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