Share Email Print

Proceedings Paper

Statistical properties of low-frequency noise of optoelectronic coupled devices
Author(s): Alicja Krystyna Konczakowska; Jacek A. Cichosz; Barbara Stawarz
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The low frequency noise generated by optoelectronic coupled devices (OCDs) was measured in the system designed and constructed by authors. The investigations were carried out for optoelectronic devices of CNY 17 type. Number of N = 106 noise samples was recorded for statistical analysis for each investigated OCD. The amplitude distributions and cumulative distribution functions were calculated for each samples data records. Statistical properties of low frequency noise of OCDs were established by estimating following parameters: mean value, variance, skewness and kurtosis. The investigated time series have not Gaussion distributions. Stationarity of the four estimated parameters was tested. It was found that the probability density function of noise could be used for the recognition of the Random Telegraph Signal (RTS) noise together with spectrum analysis.

Paper Details

Date Published: 25 May 2004
PDF: 8 pages
Proc. SPIE 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II, (25 May 2004); doi: 10.1117/12.547614
Show Author Affiliations
Alicja Krystyna Konczakowska, Gdansk Univ. of Technology (Poland)
Jacek A. Cichosz, Gdansk Univ. of Technology (Poland)
Barbara Stawarz, Gdansk Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 5472:
Noise and Information in Nanoelectronics, Sensors, and Standards II
Janusz M. Smulko; Yaroslav Blanter; Mark I. Dykman; Laszlo B. Kish, Editor(s)

© SPIE. Terms of Use
Back to Top