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Proceedings Paper

Optimization of fiber-optic/infrared measurement system and spectral modeling for enhanced temperature acquisition from an aluminized polymer membrane
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Paper Abstract

A fiber-optic/infrared (F-O/IR), non-contact temperature measurement system was characterized, and the existing technique for data collection improved, resulting in greater repeatability and precision of data collected. The F-O/IR system is a dual-waveband measurement apparatus that was recently enhanced by the installation of a tuning fork chopper directly into the fiber optical head. This permits a shortened distance between fiber and detector pair, and therefore a stronger signal can be collected. A simple closed box with the inside painted flat black was constructed and used to prevent stray radiation and convection, thus minimizing undesired effects on the measurement process. Analyses of the new data sets demonstrate that system improvements provide a cleaner and more reliable data collection capability. The exponential relationship between detector output voltage and object temperature indicates that the instrument is operating within its nominal range. The overall goal of this project was to develop a reliable technique to measure the temperature of Kapton HN, an aluminized polymer material being studied for potential future NASA missions. A spectral model that emulates the instrument was also developed in this study. Our measurements and characterization of KaptonÒ HN will be incorporated into the spectral model in order to determine the sensitivity of the instrument to background radiation, spectral emittance of Kapton HN, and other parameters that may affect thermal measurements.

Paper Details

Date Published: 12 April 2004
PDF: 8 pages
Proc. SPIE 5405, Thermosense XXVI, (12 April 2004); doi: 10.1117/12.547502
Show Author Affiliations
Christopher M Smith, James Madison Univ. (United States)
Matthew J. Rowley, James Madison Univ. (United States)

Published in SPIE Proceedings Vol. 5405:
Thermosense XXVI
Douglas D. Burleigh; K. Elliott Cramer; G. Raymond Peacock, Editor(s)

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